[elephant-devel] windows + ACL + BDB

Frank Schorr franks-muc at web.de
Mon Mar 5 08:15:23 UTC 2007 

> Interesting, BDB with ACL was clean for me (except for indexing-class- 
> opt which fails everywhere right now).  Can you tell me what the  
> error outputs were?



It depends on the history of the db, wherein I think I deleted the files before 
doing the tests yesterday. This is what I had: 


CG-USER(4): c:\lisp\binaries\allegro-a8.0-mswindows-x86\lisp\libraries\elephant\src\memutil\libmemutil.dll
; Fast loading c:\lisp\binaries\allegro-a8.0-mswindows-x86\lisp\libraries\elephant\src\memutil\memutil.fasl
; Fast loading c:\lisp\binaries\allegro-a8.0-mswindows-x86\lisp\libraries\elephant\tests\testbdb.fasl
Doing 125 pending tests of 125 tests total.
 ELE-TESTS::FIXNUMS ELE-TESTS::FIXNUM-TYPE-1 ELE-TESTS::READ-32-BIT-FIXNUM ELE-TESTS::READ-64-BIT-FIXNUM ELE-TESTS::WRITE-32-BIT-FIXNUM
 ELE-TESTS::WRITE-64-BIT-FIXNUM ELE-TESTS::BIGNUMS ELE-TESTS::FLOATS ELE-TESTS::RATIONALS ELE-TESTS::BASE-STRINGS ELE-TESTS::STRINGS ELE-TESTS::HARD-STRINGS
 ELE-TESTS::SYMBOLS ELE-TESTS::CHARS ELE-TESTS::PATHNAMES ELE-TESTS::CONSES ELE-TESTS::HASH-TABLES-1 ELE-TESTS::HASH-TABLES-2 ELE-TESTS::ARRAYS-1
 ELE-TESTS::ARRAYS-2 ELE-TESTS::TEST-DEEP-EQUALP ELE-TESTS::OBJECTS ELE-TESTS::STRUCTS ELE-TESTS::STRUCT-NON-STD-CONSTRUCT ELE-TESTS::CIRCULAR ELE:PERSISTENT
 ELE-TESTS::NON-TRANSIENT-CLASS-SLOT-1 ELE-TESTS::NON-TRANSIENT-CLASS-SLOT-2 ELE-TESTS::TRANSIENT-CLASS-SLOT ELE-TESTS::CLASS-DEFINERS ELE-TESTS::BAD-INHERITENCE
 ELE-TESTS::MIXES ELE-TESTS::MIXES-RIGHT-SLOTS ELE-TESTS::INHERIT ELE-TESTS::INHERIT-RIGHT-SLOTS ELE-TESTS::INITFORM-CLASSES ELE-TESTS::INITFORM-TEST
 ELE-TESTS::INITARG-TEST ELE-TESTS::NO-EVAL-INITFORM ELE-TESTS::REDEFCLASS MAKUNBOUND ELE-TESTS::UPDATE-CLASS CHANGE-CLASS ELE-TESTS::CHANGE-CLASS3
 ELE-TESTS::BASICPERSISTENCE ELE-TESTS::TESTOID ELE-TESTS::BTREE-MAKE ELE-TESTS::BTREE-PUT ELE-TESTS::BTREE-GET ELE:REMOVE-KV ELE-TESTS::REMOVED ELE:MAP-BTREE
 ELE-TESTS::INDEXED-BTREE-MAKE ELE-TESTS::ADD-INDICES ELE-TESTS::TEST-INDICES ELE-TESTS::INDEXED-PUT ELE-TESTS::INDEXED-GET ELE-TESTS::SIMPLE-SLOT-GET
 ELE-TESTS::INDEXED-GET-FROM-SLOT1 ELE-TESTS::INDEXED-GET-FROM-SLOT2 ELE-TESTS::REMOVE-KV-INDEXED ELE-TESTS::NO-KEY-NOR-INDICES ELE-TESTS::REMOVE-KV-FROM-SLOT1
 ELE-TESTS::NO-KEY-NOR-INDICES-SLOT1 ELE-TESTS::REMOVE-KV-FROM-SLOT2 ELE-TESTS::NO-KEY-NOR-INDICES-SLOT2 ELE-TESTS::MAP-INDEXED ELE-TESTS::GET-FIRST
 ELE-TESTS::GET-FIRST2 ELE-TESTS::GET-LAST ELE-TESTS::GET-LAST2 SET ELE-TESTS::SET2 ELE-TESTS::SET-RANGE ELE-TESTS::SET-RANGE2 ELE-TESTS::MAP-INDEXED-INDEX
 ELE-TESTS::REM-KV ELE-TESTS::REM-IDEXKV ELE-TESTS::MAKE-INDEXED2 ELE-TESTS::ADD-INDICES2 ELE-TESTS::PUT-INDEXED2 ELE-TESTS::GET-INDEXED2 ELE-TESTS::GET-FROM-INDEX3
 ELE-TESTS::DUP-TEST ELE-TESTS::NODUP-TEST ELE-TESTS::PREV-NODUP-TEST ELE-TESTS::PNODUP-TEST ELE-TESTS::PPREV-NODUP-TEST ELE-TESTS::CUR-DEL1
 ELE-TESTS::INDEXED-DELETE ELE-TESTS::TEST-DELETED ELE-TESTS::INDEXED-DELETE2 ELE-TESTS::TEST-DELETED2 ELE-TESTS::CUR-DEL2 ELE-TESTS::GET-BOTH ELE-TESTS::PGET-BOTH
 ELE-TESTS::PGET-BOTH-RANGE ELE-TESTS::PCURSOR ELE-TESTS::NEWINDEX ELE-TESTS::PCURSOR2 ELE-TESTS::ADD-GET-REMOVE ELE-TESTS::ADD-GET-REMOVE-SYMBOL ELE-TESTS::EXISTSP
Warning: Manually finalizing class IDX-ONE
 ELE-TESTS::DISABLE-CLASS-INDEXING-TEST ELE-TESTS::INDEXING-BASIC-TRIVIAL ELE-TESTS::INDEXING-BASIC
Test ELE-TESTS::INDEXING-CLASS-OPT failed
Form: (PROGN (WHEN (ELE:CLASS-INDEXEDP-BY-NAME 'ELE-TESTS::IDX-CSLOT)
               (ELE:DISABLE-CLASS-INDEXING 'ELE-TESTS::IDX-CSLOT :ERRORP NIL)
               (SETF (FIND-CLASS 'ELE-TESTS::IDX-CSLOT) NIL))
             (DEFCLASS ELE-TESTS::IDX-CSLOT NIL ((ELE-TESTS::SLOT1 :INITARG :SLOT1 :INITFORM 0 :ACCESSOR ELE-TESTS::SLOT1))
                       (:METACLASS ELE:PERSISTENT-METACLASS :INDEX T))
             (VALUES (ELE:CLASS-INDEXEDP-BY-NAME 'ELE-TESTS::IDX-CSLOT)))
Expected value: T
Actual value: NIL.
 ELE-TESTS::INDEXING-INHERIT
Warning: Manually finalizing class IDX-FOUR
 ELE-TESTS::INDEXING-RANGE
Test ELE-TESTS::INDEXING-SLOT-MAKUNBOUND failed
Form: (PROGN (WHEN (ELE:CLASS-INDEXEDP-BY-NAME 'ELE-TESTS::IDX-UNBOUND-DEL)
               (ELE:DISABLE-CLASS-INDEXING 'ELE-TESTS::IDX-UNBOUND-DEL :ERRORP NIL)
               (SETF (FIND-CLASS 'ELE-TESTS::IDX-FIVE-DEL) NIL))
             (DEFCLASS ELE-TESTS::IDX-UNBOUND-DEL NIL ((ELE-TESTS::SLOT1 :INITARG :SLOT1 :INITFORM 1 :ACCESSOR ELE-TESTS::SLOT1 :INDEX T))
                       (:METACLASS ELE:PERSISTENT-METACLASS))
             (ELE:WITH-TRANSACTION (:STORE-CONTROLLER ELE:*STORE-CONTROLLER*) (MAKE-INSTANCE 'ELE-TESTS::IDX-UNBOUND-DEL :SLOT1 10))
             (LET ((ELE-TESTS::ORIG-LEN (LENGTH (ELE:GET-INSTANCES-BY-CLASS 'ELE-TESTS::IDX-UNBOUND-DEL)))
                   (ELE-TESTS::ORIG-OBJ (ELE:GET-INSTANCE-BY-VALUE 'ELE-TESTS::IDX-UNBOUND-DEL 'ELE-TESTS::SLOT1 10)))
               (SLOT-MAKUNBOUND ELE-TESTS::ORIG-OBJ 'ELE-TESTS::SLOT1)
               (LET ((ELE-TESTS::NEW-LEN (LENGTH (ELE:GET-INSTANCES-BY-CLASS 'ELE-TESTS::IDX-UNBOUND-DEL)))
                     (ELE-TESTS::INDEX-OBJ (ELE:GET-INSTANCE-BY-VALUE 'ELE-TESTS::IDX-UNBOUND-DEL 'ELE-TESTS::SLOT1 10)))
                 (VALUES ELE-TESTS::ORIG-LEN ELE-TESTS::NEW-LEN ELE-TESTS::INDEX-OBJ))))
Expected values: 1
                 1
                 NIL
Actual values: 4
               4
               NIL.
Warning: Manually finalizing class IDX-FIVE-DEL
Test ELE-TESTS::INDEXING-WIPE-INDEX failed
Form: (PROGN (WHEN (ELE:CLASS-INDEXEDP-BY-NAME 'ELE-TESTS::IDX-FIVE-DEL)
               (ELE:DISABLE-CLASS-INDEXING 'ELE-TESTS::IDX-FIVE-DEL :ERRORP NIL)
               (SETF (FIND-CLASS 'ELE-TESTS::IDX-FIVE-DEL) NIL))
             (DEFCLASS ELE-TESTS::IDX-FIVE-DEL NIL ((ELE-TESTS::SLOT1 :INITARG :SLOT1 :INITFORM 1 :ACCESSOR ELE-TESTS::SLOT1 :INDEX T))
                       (:METACLASS ELE:PERSISTENT-METACLASS))
             (ELE:WITH-TRANSACTION (:STORE-CONTROLLER ELE:*STORE-CONTROLLER*)
               (ELE:DROP-INSTANCES (ELE:GET-INSTANCES-BY-CLASS 'ELE-TESTS::IDX-FIVE-DEL))
               (MAKE-INSTANCE 'ELE-TESTS::IDX-FIVE-DEL))
             (LET ((ELE-TESTS::R1 (ELE:GET-INSTANCES-BY-VALUE 'ELE-TESTS::IDX-FIVE-DEL 'ELE-TESTS::SLOT1 1)))
               (DEFCLASS ELE-TESTS::IDX-FIVE-DEL NIL ((ELE-TESTS::SLOT1 :INITARG :SLOT1 :INITFORM 1 :ACCESSOR ELE-TESTS::SLOT1))
                         (:METACLASS ELE:PERSISTENT-METACLASS))
               (VALUES (EQ (LENGTH ELE-TESTS::R1) 1) (ELE-TESTS::SIGNALS-ERROR (ELE:GET-INSTANCES-BY-VALUE 'ELE-TESTS::IDX-FIVE-DEL 'ELE-TESTS::SLOT1 1))
                       (NULL (ELE:GET-INDEX (ELE:GET-VALUE 'ELE-TESTS::IDX-FIVE-DEL (ELE:CONTROLLER-CLASS-ROOT ELE:*STORE-CONTROLLER*)) 'ELE-TESTS::SLOT1)))))
Expected values: T
                 T
                 T
Actual value: #<SIMPLE-ERROR @ #x210f543a>.
Warning: Manually finalizing class IDX-FIVE
 ELE-TESTS::INDEXING-RECONNECT-DB
Warning: Manually finalizing class IDX-SIX
Warning: Manually finalizing class IDX-SEVEN
 ELE-TESTS::INDEXING-CHANGE-CLASS
Warning: Manually finalizing class IDX-EIGHT
 ELE-TESTS::INDEXING-REDEF-CLASS
Warning: Manually finalizing class STRESS-INDEX

Ranged get of 10/700 objects = Linear: 0.942 sec Indexed: 0.02 sec
 ELE-TESTS::INDEXING-TIMING
Single store mode: ignoring ELE-TESTS::REMOVE-ELEMENT
Single store mode: ignoring ELE-TESTS::MIGRATE-BASIC
Single store mode: ignoring ELE-TESTS::MIGRATE-BTREE
Single store mode: ignoring ELE-TESTS::MIGRATE-IDX-BTREE
Single store mode: ignoring ELE-TESTS::MIGRATE-PCLASS
Single store mode: ignoring  ELE-TESTS::MIGRATE-IPCLASS ELE-TESTS::PREPARES-BDB ELE-TESTS::TEST-SEQ1 ELE-TESTS::TEST-SEQ2 ELE-TESTS::CLEANSUP-BDB
3 out of 125 total tests failed: ELE-TESTS::INDEXING-CLASS-OPT, ELE-TESTS::INDEXING-SLOT-MAKUNBOUND, ELE-TESTS::INDEXING-WIPE-INDEX.
NIL

*************************************************

Now I deleted all files in the db directory and received this:

1 out of 125 total tests failed: ELE-TESTS::INDEXING-CLASS-OPT.

Second and more times without deleting the files: 

Doing 125 pending tests of 125 tests total.
 ELE-TESTS::FIXNUMS ELE-TESTS::FIXNUM-TYPE-1 ELE-TESTS::READ-32-BIT-FIXNUM ELE-TESTS::READ-64-BIT-FIXNUM ELE-TESTS::WRITE-32-BIT-FIXNUM
 ELE-TESTS::WRITE-64-BIT-FIXNUM ELE-TESTS::BIGNUMS ELE-TESTS::FLOATS ELE-TESTS::RATIONALS ELE-TESTS::BASE-STRINGS ELE-TESTS::STRINGS ELE-TESTS::HARD-STRINGS
 ELE-TESTS::SYMBOLS ELE-TESTS::CHARS ELE-TESTS::PATHNAMES ELE-TESTS::CONSES ELE-TESTS::HASH-TABLES-1 ELE-TESTS::HASH-TABLES-2 ELE-TESTS::ARRAYS-1
 ELE-TESTS::ARRAYS-2 ELE-TESTS::TEST-DEEP-EQUALP ELE-TESTS::OBJECTS ELE-TESTS::STRUCTS ELE-TESTS::STRUCT-NON-STD-CONSTRUCT ELE-TESTS::CIRCULAR ELE:PERSISTENT
 ELE-TESTS::NON-TRANSIENT-CLASS-SLOT-1 ELE-TESTS::NON-TRANSIENT-CLASS-SLOT-2 ELE-TESTS::TRANSIENT-CLASS-SLOT ELE-TESTS::CLASS-DEFINERS ELE-TESTS::BAD-INHERITENCE
 ELE-TESTS::MIXES ELE-TESTS::MIXES-RIGHT-SLOTS ELE-TESTS::INHERIT ELE-TESTS::INHERIT-RIGHT-SLOTS ELE-TESTS::INITFORM-CLASSES ELE-TESTS::INITFORM-TEST
 ELE-TESTS::INITARG-TEST ELE-TESTS::NO-EVAL-INITFORM ELE-TESTS::REDEFCLASS MAKUNBOUND ELE-TESTS::UPDATE-CLASS CHANGE-CLASS ELE-TESTS::CHANGE-CLASS3
 ELE-TESTS::BASICPERSISTENCE ELE-TESTS::TESTOID ELE-TESTS::BTREE-MAKE ELE-TESTS::BTREE-PUT ELE-TESTS::BTREE-GET ELE:REMOVE-KV ELE-TESTS::REMOVED ELE:MAP-BTREE
 ELE-TESTS::INDEXED-BTREE-MAKE ELE-TESTS::ADD-INDICES ELE-TESTS::TEST-INDICES ELE-TESTS::INDEXED-PUT ELE-TESTS::INDEXED-GET ELE-TESTS::SIMPLE-SLOT-GET
 ELE-TESTS::INDEXED-GET-FROM-SLOT1 ELE-TESTS::INDEXED-GET-FROM-SLOT2 ELE-TESTS::REMOVE-KV-INDEXED ELE-TESTS::NO-KEY-NOR-INDICES ELE-TESTS::REMOVE-KV-FROM-SLOT1
 ELE-TESTS::NO-KEY-NOR-INDICES-SLOT1 ELE-TESTS::REMOVE-KV-FROM-SLOT2 ELE-TESTS::NO-KEY-NOR-INDICES-SLOT2 ELE-TESTS::MAP-INDEXED ELE-TESTS::GET-FIRST
 ELE-TESTS::GET-FIRST2 ELE-TESTS::GET-LAST ELE-TESTS::GET-LAST2 SET ELE-TESTS::SET2 ELE-TESTS::SET-RANGE ELE-TESTS::SET-RANGE2 ELE-TESTS::MAP-INDEXED-INDEX
 ELE-TESTS::REM-KV ELE-TESTS::REM-IDEXKV ELE-TESTS::MAKE-INDEXED2 ELE-TESTS::ADD-INDICES2 ELE-TESTS::PUT-INDEXED2 ELE-TESTS::GET-INDEXED2 ELE-TESTS::GET-FROM-INDEX3
 ELE-TESTS::DUP-TEST ELE-TESTS::NODUP-TEST ELE-TESTS::PREV-NODUP-TEST ELE-TESTS::PNODUP-TEST ELE-TESTS::PPREV-NODUP-TEST ELE-TESTS::CUR-DEL1
 ELE-TESTS::INDEXED-DELETE ELE-TESTS::TEST-DELETED ELE-TESTS::INDEXED-DELETE2 ELE-TESTS::TEST-DELETED2 ELE-TESTS::CUR-DEL2 ELE-TESTS::GET-BOTH ELE-TESTS::PGET-BOTH
 ELE-TESTS::PGET-BOTH-RANGE ELE-TESTS::PCURSOR ELE-TESTS::NEWINDEX ELE-TESTS::PCURSOR2 ELE-TESTS::ADD-GET-REMOVE ELE-TESTS::ADD-GET-REMOVE-SYMBOL ELE-TESTS::EXISTSP
Warning: Manually finalizing class IDX-ONE
 ELE-TESTS::DISABLE-CLASS-INDEXING-TEST ELE-TESTS::INDEXING-BASIC-TRIVIAL ELE-TESTS::INDEXING-BASIC
Test ELE-TESTS::INDEXING-CLASS-OPT failed
Form: (PROGN (WHEN (ELE:CLASS-INDEXEDP-BY-NAME 'ELE-TESTS::IDX-CSLOT)
               (ELE:DISABLE-CLASS-INDEXING 'ELE-TESTS::IDX-CSLOT :ERRORP NIL)
               (SETF (FIND-CLASS 'ELE-TESTS::IDX-CSLOT) NIL))
             (DEFCLASS ELE-TESTS::IDX-CSLOT NIL ((ELE-TESTS::SLOT1 :INITARG :SLOT1 :INITFORM 0 :ACCESSOR ELE-TESTS::SLOT1))
                       (:METACLASS ELE:PERSISTENT-METACLASS :INDEX T))
             (VALUES (ELE:CLASS-INDEXEDP-BY-NAME 'ELE-TESTS::IDX-CSLOT)))
Expected value: T
Actual value: NIL.
 ELE-TESTS::INDEXING-INHERIT ELE-TESTS::INDEXING-RANGE ELE-TESTS::INDEXING-SLOT-MAKUNBOUND
Warning: Manually finalizing class IDX-FIVE-DEL
Test ELE-TESTS::INDEXING-WIPE-INDEX failed
Form: (PROGN (WHEN (ELE:CLASS-INDEXEDP-BY-NAME 'ELE-TESTS::IDX-FIVE-DEL)
               (ELE:DISABLE-CLASS-INDEXING 'ELE-TESTS::IDX-FIVE-DEL :ERRORP NIL)
               (SETF (FIND-CLASS 'ELE-TESTS::IDX-FIVE-DEL) NIL))
             (DEFCLASS ELE-TESTS::IDX-FIVE-DEL NIL ((ELE-TESTS::SLOT1 :INITARG :SLOT1 :INITFORM 1 :ACCESSOR ELE-TESTS::SLOT1 :INDEX T))
                       (:METACLASS ELE:PERSISTENT-METACLASS))
             (ELE:WITH-TRANSACTION (:STORE-CONTROLLER ELE:*STORE-CONTROLLER*)
               (ELE:DROP-INSTANCES (ELE:GET-INSTANCES-BY-CLASS 'ELE-TESTS::IDX-FIVE-DEL))
               (MAKE-INSTANCE 'ELE-TESTS::IDX-FIVE-DEL))
             (LET ((ELE-TESTS::R1 (ELE:GET-INSTANCES-BY-VALUE 'ELE-TESTS::IDX-FIVE-DEL 'ELE-TESTS::SLOT1 1)))
               (DEFCLASS ELE-TESTS::IDX-FIVE-DEL NIL ((ELE-TESTS::SLOT1 :INITARG :SLOT1 :INITFORM 1 :ACCESSOR ELE-TESTS::SLOT1))
                         (:METACLASS ELE:PERSISTENT-METACLASS))
               (VALUES (EQ (LENGTH ELE-TESTS::R1) 1) (ELE-TESTS::SIGNALS-ERROR (ELE:GET-INSTANCES-BY-VALUE 'ELE-TESTS::IDX-FIVE-DEL 'ELE-TESTS::SLOT1 1))
                       (NULL (ELE:GET-INDEX (ELE:GET-VALUE 'ELE-TESTS::IDX-FIVE-DEL (ELE:CONTROLLER-CLASS-ROOT ELE:*STORE-CONTROLLER*)) 'ELE-TESTS::SLOT1)))))
Expected values: T
                 T
                 T
Actual value: #<SIMPLE-ERROR @ #x21202b72>.
 ELE-TESTS::INDEXING-RECONNECT-DB ELE-TESTS::INDEXING-CHANGE-CLASS ELE-TESTS::INDEXING-REDEF-CLASS
Ranged get of 10/700 objects = Linear: 1.713 sec Indexed: 0.02 sec
 ELE-TESTS::INDEXING-TIMING
Single store mode: ignoring ELE-TESTS::REMOVE-ELEMENT
Single store mode: ignoring ELE-TESTS::MIGRATE-BASIC
Single store mode: ignoring ELE-TESTS::MIGRATE-BTREE
Single store mode: ignoring ELE-TESTS::MIGRATE-IDX-BTREE
Single store mode: ignoring ELE-TESTS::MIGRATE-PCLASS
Single store mode: ignoring  ELE-TESTS::MIGRATE-IPCLASS ELE-TESTS::PREPARES-BDB ELE-TESTS::TEST-SEQ1 ELE-TESTS::TEST-SEQ2 ELE-TESTS::CLEANSUP-BDB
2 out of 125 total tests failed: ELE-TESTS::INDEXING-CLASS-OPT, ELE-TESTS::INDEXING-WIPE-INDEX.
NIL


Now I can not reproduc the three errors. 

Frank
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