[elephant-devel] windows + ACL + BDB
Ian Eslick
eslick at csail.mit.edu
Mon Mar 5 14:27:15 UTC 2007
That's pretty good then! I'm trying to remove the problems with
repeated tests so I'll see if I reproduce your error on indexing-wipe-
index.
Ian
On Mar 5, 2007, at 3:15 AM, Frank Schorr wrote:
>> Interesting, BDB with ACL was clean for me (except for indexing-
>> class-
>> opt which fails everywhere right now). Can you tell me what the
>> error outputs were?
>
>
>
> It depends on the history of the db, wherein I think I deleted the
> files before
> doing the tests yesterday. This is what I had:
>
>
> CG-USER(4): c:\lisp\binaries\allegro-a8.0-mswindows-x86\lisp
> \libraries\elephant\src\memutil\libmemutil.dll
> ; Fast loading c:\lisp\binaries\allegro-a8.0-mswindows-x86\lisp
> \libraries\elephant\src\memutil\memutil.fasl
> ; Fast loading c:\lisp\binaries\allegro-a8.0-mswindows-x86\lisp
> \libraries\elephant\tests\testbdb.fasl
> Doing 125 pending tests of 125 tests total.
> ELE-TESTS::FIXNUMS ELE-TESTS::FIXNUM-TYPE-1 ELE-TESTS::READ-32-BIT-
> FIXNUM ELE-TESTS::READ-64-BIT-FIXNUM ELE-TESTS::WRITE-32-BIT-FIXNUM
> ELE-TESTS::WRITE-64-BIT-FIXNUM ELE-TESTS::BIGNUMS ELE-
> TESTS::FLOATS ELE-TESTS::RATIONALS ELE-TESTS::BASE-STRINGS ELE-
> TESTS::STRINGS ELE-TESTS::HARD-STRINGS
> ELE-TESTS::SYMBOLS ELE-TESTS::CHARS ELE-TESTS::PATHNAMES ELE-
> TESTS::CONSES ELE-TESTS::HASH-TABLES-1 ELE-TESTS::HASH-TABLES-2 ELE-
> TESTS::ARRAYS-1
> ELE-TESTS::ARRAYS-2 ELE-TESTS::TEST-DEEP-EQUALP ELE-TESTS::OBJECTS
> ELE-TESTS::STRUCTS ELE-TESTS::STRUCT-NON-STD-CONSTRUCT ELE-
> TESTS::CIRCULAR ELE:PERSISTENT
> ELE-TESTS::NON-TRANSIENT-CLASS-SLOT-1 ELE-TESTS::NON-TRANSIENT-
> CLASS-SLOT-2 ELE-TESTS::TRANSIENT-CLASS-SLOT ELE-TESTS::CLASS-
> DEFINERS ELE-TESTS::BAD-INHERITENCE
> ELE-TESTS::MIXES ELE-TESTS::MIXES-RIGHT-SLOTS ELE-TESTS::INHERIT
> ELE-TESTS::INHERIT-RIGHT-SLOTS ELE-TESTS::INITFORM-CLASSES ELE-
> TESTS::INITFORM-TEST
> ELE-TESTS::INITARG-TEST ELE-TESTS::NO-EVAL-INITFORM ELE-
> TESTS::REDEFCLASS MAKUNBOUND ELE-TESTS::UPDATE-CLASS CHANGE-CLASS
> ELE-TESTS::CHANGE-CLASS3
> ELE-TESTS::BASICPERSISTENCE ELE-TESTS::TESTOID ELE-TESTS::BTREE-
> MAKE ELE-TESTS::BTREE-PUT ELE-TESTS::BTREE-GET ELE:REMOVE-KV ELE-
> TESTS::REMOVED ELE:MAP-BTREE
> ELE-TESTS::INDEXED-BTREE-MAKE ELE-TESTS::ADD-INDICES ELE-
> TESTS::TEST-INDICES ELE-TESTS::INDEXED-PUT ELE-TESTS::INDEXED-GET
> ELE-TESTS::SIMPLE-SLOT-GET
> ELE-TESTS::INDEXED-GET-FROM-SLOT1 ELE-TESTS::INDEXED-GET-FROM-
> SLOT2 ELE-TESTS::REMOVE-KV-INDEXED ELE-TESTS::NO-KEY-NOR-INDICES
> ELE-TESTS::REMOVE-KV-FROM-SLOT1
> ELE-TESTS::NO-KEY-NOR-INDICES-SLOT1 ELE-TESTS::REMOVE-KV-FROM-
> SLOT2 ELE-TESTS::NO-KEY-NOR-INDICES-SLOT2 ELE-TESTS::MAP-INDEXED
> ELE-TESTS::GET-FIRST
> ELE-TESTS::GET-FIRST2 ELE-TESTS::GET-LAST ELE-TESTS::GET-LAST2 SET
> ELE-TESTS::SET2 ELE-TESTS::SET-RANGE ELE-TESTS::SET-RANGE2 ELE-
> TESTS::MAP-INDEXED-INDEX
> ELE-TESTS::REM-KV ELE-TESTS::REM-IDEXKV ELE-TESTS::MAKE-INDEXED2
> ELE-TESTS::ADD-INDICES2 ELE-TESTS::PUT-INDEXED2 ELE-TESTS::GET-
> INDEXED2 ELE-TESTS::GET-FROM-INDEX3
> ELE-TESTS::DUP-TEST ELE-TESTS::NODUP-TEST ELE-TESTS::PREV-NODUP-
> TEST ELE-TESTS::PNODUP-TEST ELE-TESTS::PPREV-NODUP-TEST ELE-
> TESTS::CUR-DEL1
> ELE-TESTS::INDEXED-DELETE ELE-TESTS::TEST-DELETED ELE-
> TESTS::INDEXED-DELETE2 ELE-TESTS::TEST-DELETED2 ELE-TESTS::CUR-DEL2
> ELE-TESTS::GET-BOTH ELE-TESTS::PGET-BOTH
> ELE-TESTS::PGET-BOTH-RANGE ELE-TESTS::PCURSOR ELE-TESTS::NEWINDEX
> ELE-TESTS::PCURSOR2 ELE-TESTS::ADD-GET-REMOVE ELE-TESTS::ADD-GET-
> REMOVE-SYMBOL ELE-TESTS::EXISTSP
> Warning: Manually finalizing class IDX-ONE
> ELE-TESTS::DISABLE-CLASS-INDEXING-TEST ELE-TESTS::INDEXING-BASIC-
> TRIVIAL ELE-TESTS::INDEXING-BASIC
> Test ELE-TESTS::INDEXING-CLASS-OPT failed
> Form: (PROGN (WHEN (ELE:CLASS-INDEXEDP-BY-NAME 'ELE-TESTS::IDX-CSLOT)
> (ELE:DISABLE-CLASS-INDEXING 'ELE-TESTS::IDX-
> CSLOT :ERRORP NIL)
> (SETF (FIND-CLASS 'ELE-TESTS::IDX-CSLOT) NIL))
> (DEFCLASS ELE-TESTS::IDX-CSLOT NIL ((ELE-
> TESTS::SLOT1 :INITARG :SLOT1 :INITFORM 0 :ACCESSOR ELE-TESTS::SLOT1))
> (:METACLASS ELE:PERSISTENT-METACLASS :INDEX T))
> (VALUES (ELE:CLASS-INDEXEDP-BY-NAME 'ELE-TESTS::IDX-
> CSLOT)))
> Expected value: T
> Actual value: NIL.
> ELE-TESTS::INDEXING-INHERIT
> Warning: Manually finalizing class IDX-FOUR
> ELE-TESTS::INDEXING-RANGE
> Test ELE-TESTS::INDEXING-SLOT-MAKUNBOUND failed
> Form: (PROGN (WHEN (ELE:CLASS-INDEXEDP-BY-NAME 'ELE-TESTS::IDX-
> UNBOUND-DEL)
> (ELE:DISABLE-CLASS-INDEXING 'ELE-TESTS::IDX-UNBOUND-
> DEL :ERRORP NIL)
> (SETF (FIND-CLASS 'ELE-TESTS::IDX-FIVE-DEL) NIL))
> (DEFCLASS ELE-TESTS::IDX-UNBOUND-DEL NIL ((ELE-
> TESTS::SLOT1 :INITARG :SLOT1 :INITFORM 1 :ACCESSOR ELE-
> TESTS::SLOT1 :INDEX T))
> (:METACLASS ELE:PERSISTENT-METACLASS))
> (ELE:WITH-TRANSACTION (:STORE-CONTROLLER ELE:*STORE-
> CONTROLLER*) (MAKE-INSTANCE 'ELE-TESTS::IDX-UNBOUND-DEL :SLOT1 10))
> (LET ((ELE-TESTS::ORIG-LEN (LENGTH (ELE:GET-INSTANCES-
> BY-CLASS 'ELE-TESTS::IDX-UNBOUND-DEL)))
> (ELE-TESTS::ORIG-OBJ (ELE:GET-INSTANCE-BY-VALUE
> 'ELE-TESTS::IDX-UNBOUND-DEL 'ELE-TESTS::SLOT1 10)))
> (SLOT-MAKUNBOUND ELE-TESTS::ORIG-OBJ 'ELE-TESTS::SLOT1)
> (LET ((ELE-TESTS::NEW-LEN (LENGTH (ELE:GET-INSTANCES-
> BY-CLASS 'ELE-TESTS::IDX-UNBOUND-DEL)))
> (ELE-TESTS::INDEX-OBJ (ELE:GET-INSTANCE-BY-
> VALUE 'ELE-TESTS::IDX-UNBOUND-DEL 'ELE-TESTS::SLOT1 10)))
> (VALUES ELE-TESTS::ORIG-LEN ELE-TESTS::NEW-LEN ELE-
> TESTS::INDEX-OBJ))))
> Expected values: 1
> 1
> NIL
> Actual values: 4
> 4
> NIL.
> Warning: Manually finalizing class IDX-FIVE-DEL
> Test ELE-TESTS::INDEXING-WIPE-INDEX failed
> Form: (PROGN (WHEN (ELE:CLASS-INDEXEDP-BY-NAME 'ELE-TESTS::IDX-FIVE-
> DEL)
> (ELE:DISABLE-CLASS-INDEXING 'ELE-TESTS::IDX-FIVE-
> DEL :ERRORP NIL)
> (SETF (FIND-CLASS 'ELE-TESTS::IDX-FIVE-DEL) NIL))
> (DEFCLASS ELE-TESTS::IDX-FIVE-DEL NIL ((ELE-
> TESTS::SLOT1 :INITARG :SLOT1 :INITFORM 1 :ACCESSOR ELE-
> TESTS::SLOT1 :INDEX T))
> (:METACLASS ELE:PERSISTENT-METACLASS))
> (ELE:WITH-TRANSACTION (:STORE-CONTROLLER ELE:*STORE-
> CONTROLLER*)
> (ELE:DROP-INSTANCES (ELE:GET-INSTANCES-BY-CLASS 'ELE-
> TESTS::IDX-FIVE-DEL))
> (MAKE-INSTANCE 'ELE-TESTS::IDX-FIVE-DEL))
> (LET ((ELE-TESTS::R1 (ELE:GET-INSTANCES-BY-VALUE 'ELE-
> TESTS::IDX-FIVE-DEL 'ELE-TESTS::SLOT1 1)))
> (DEFCLASS ELE-TESTS::IDX-FIVE-DEL NIL ((ELE-
> TESTS::SLOT1 :INITARG :SLOT1 :INITFORM 1 :ACCESSOR ELE-TESTS::SLOT1))
> (:METACLASS ELE:PERSISTENT-METACLASS))
> (VALUES (EQ (LENGTH ELE-TESTS::R1) 1) (ELE-
> TESTS::SIGNALS-ERROR (ELE:GET-INSTANCES-BY-VALUE 'ELE-TESTS::IDX-
> FIVE-DEL 'ELE-TESTS::SLOT1 1))
> (NULL (ELE:GET-INDEX (ELE:GET-VALUE 'ELE-
> TESTS::IDX-FIVE-DEL (ELE:CONTROLLER-CLASS-ROOT ELE:*STORE-
> CONTROLLER*)) 'ELE-TESTS::SLOT1)))))
> Expected values: T
> T
> T
> Actual value: #<SIMPLE-ERROR @ #x210f543a>.
> Warning: Manually finalizing class IDX-FIVE
> ELE-TESTS::INDEXING-RECONNECT-DB
> Warning: Manually finalizing class IDX-SIX
> Warning: Manually finalizing class IDX-SEVEN
> ELE-TESTS::INDEXING-CHANGE-CLASS
> Warning: Manually finalizing class IDX-EIGHT
> ELE-TESTS::INDEXING-REDEF-CLASS
> Warning: Manually finalizing class STRESS-INDEX
>
> Ranged get of 10/700 objects = Linear: 0.942 sec Indexed: 0.02 sec
> ELE-TESTS::INDEXING-TIMING
> Single store mode: ignoring ELE-TESTS::REMOVE-ELEMENT
> Single store mode: ignoring ELE-TESTS::MIGRATE-BASIC
> Single store mode: ignoring ELE-TESTS::MIGRATE-BTREE
> Single store mode: ignoring ELE-TESTS::MIGRATE-IDX-BTREE
> Single store mode: ignoring ELE-TESTS::MIGRATE-PCLASS
> Single store mode: ignoring ELE-TESTS::MIGRATE-IPCLASS ELE-
> TESTS::PREPARES-BDB ELE-TESTS::TEST-SEQ1 ELE-TESTS::TEST-SEQ2 ELE-
> TESTS::CLEANSUP-BDB
> 3 out of 125 total tests failed: ELE-TESTS::INDEXING-CLASS-OPT, ELE-
> TESTS::INDEXING-SLOT-MAKUNBOUND, ELE-TESTS::INDEXING-WIPE-INDEX.
> NIL
>
> *************************************************
>
> Now I deleted all files in the db directory and received this:
>
> 1 out of 125 total tests failed: ELE-TESTS::INDEXING-CLASS-OPT.
>
> Second and more times without deleting the files:
>
> Doing 125 pending tests of 125 tests total.
> ELE-TESTS::FIXNUMS ELE-TESTS::FIXNUM-TYPE-1 ELE-TESTS::READ-32-BIT-
> FIXNUM ELE-TESTS::READ-64-BIT-FIXNUM ELE-TESTS::WRITE-32-BIT-FIXNUM
> ELE-TESTS::WRITE-64-BIT-FIXNUM ELE-TESTS::BIGNUMS ELE-
> TESTS::FLOATS ELE-TESTS::RATIONALS ELE-TESTS::BASE-STRINGS ELE-
> TESTS::STRINGS ELE-TESTS::HARD-STRINGS
> ELE-TESTS::SYMBOLS ELE-TESTS::CHARS ELE-TESTS::PATHNAMES ELE-
> TESTS::CONSES ELE-TESTS::HASH-TABLES-1 ELE-TESTS::HASH-TABLES-2 ELE-
> TESTS::ARRAYS-1
> ELE-TESTS::ARRAYS-2 ELE-TESTS::TEST-DEEP-EQUALP ELE-TESTS::OBJECTS
> ELE-TESTS::STRUCTS ELE-TESTS::STRUCT-NON-STD-CONSTRUCT ELE-
> TESTS::CIRCULAR ELE:PERSISTENT
> ELE-TESTS::NON-TRANSIENT-CLASS-SLOT-1 ELE-TESTS::NON-TRANSIENT-
> CLASS-SLOT-2 ELE-TESTS::TRANSIENT-CLASS-SLOT ELE-TESTS::CLASS-
> DEFINERS ELE-TESTS::BAD-INHERITENCE
> ELE-TESTS::MIXES ELE-TESTS::MIXES-RIGHT-SLOTS ELE-TESTS::INHERIT
> ELE-TESTS::INHERIT-RIGHT-SLOTS ELE-TESTS::INITFORM-CLASSES ELE-
> TESTS::INITFORM-TEST
> ELE-TESTS::INITARG-TEST ELE-TESTS::NO-EVAL-INITFORM ELE-
> TESTS::REDEFCLASS MAKUNBOUND ELE-TESTS::UPDATE-CLASS CHANGE-CLASS
> ELE-TESTS::CHANGE-CLASS3
> ELE-TESTS::BASICPERSISTENCE ELE-TESTS::TESTOID ELE-TESTS::BTREE-
> MAKE ELE-TESTS::BTREE-PUT ELE-TESTS::BTREE-GET ELE:REMOVE-KV ELE-
> TESTS::REMOVED ELE:MAP-BTREE
> ELE-TESTS::INDEXED-BTREE-MAKE ELE-TESTS::ADD-INDICES ELE-
> TESTS::TEST-INDICES ELE-TESTS::INDEXED-PUT ELE-TESTS::INDEXED-GET
> ELE-TESTS::SIMPLE-SLOT-GET
> ELE-TESTS::INDEXED-GET-FROM-SLOT1 ELE-TESTS::INDEXED-GET-FROM-
> SLOT2 ELE-TESTS::REMOVE-KV-INDEXED ELE-TESTS::NO-KEY-NOR-INDICES
> ELE-TESTS::REMOVE-KV-FROM-SLOT1
> ELE-TESTS::NO-KEY-NOR-INDICES-SLOT1 ELE-TESTS::REMOVE-KV-FROM-
> SLOT2 ELE-TESTS::NO-KEY-NOR-INDICES-SLOT2 ELE-TESTS::MAP-INDEXED
> ELE-TESTS::GET-FIRST
> ELE-TESTS::GET-FIRST2 ELE-TESTS::GET-LAST ELE-TESTS::GET-LAST2 SET
> ELE-TESTS::SET2 ELE-TESTS::SET-RANGE ELE-TESTS::SET-RANGE2 ELE-
> TESTS::MAP-INDEXED-INDEX
> ELE-TESTS::REM-KV ELE-TESTS::REM-IDEXKV ELE-TESTS::MAKE-INDEXED2
> ELE-TESTS::ADD-INDICES2 ELE-TESTS::PUT-INDEXED2 ELE-TESTS::GET-
> INDEXED2 ELE-TESTS::GET-FROM-INDEX3
> ELE-TESTS::DUP-TEST ELE-TESTS::NODUP-TEST ELE-TESTS::PREV-NODUP-
> TEST ELE-TESTS::PNODUP-TEST ELE-TESTS::PPREV-NODUP-TEST ELE-
> TESTS::CUR-DEL1
> ELE-TESTS::INDEXED-DELETE ELE-TESTS::TEST-DELETED ELE-
> TESTS::INDEXED-DELETE2 ELE-TESTS::TEST-DELETED2 ELE-TESTS::CUR-DEL2
> ELE-TESTS::GET-BOTH ELE-TESTS::PGET-BOTH
> ELE-TESTS::PGET-BOTH-RANGE ELE-TESTS::PCURSOR ELE-TESTS::NEWINDEX
> ELE-TESTS::PCURSOR2 ELE-TESTS::ADD-GET-REMOVE ELE-TESTS::ADD-GET-
> REMOVE-SYMBOL ELE-TESTS::EXISTSP
> Warning: Manually finalizing class IDX-ONE
> ELE-TESTS::DISABLE-CLASS-INDEXING-TEST ELE-TESTS::INDEXING-BASIC-
> TRIVIAL ELE-TESTS::INDEXING-BASIC
> Test ELE-TESTS::INDEXING-CLASS-OPT failed
> Form: (PROGN (WHEN (ELE:CLASS-INDEXEDP-BY-NAME 'ELE-TESTS::IDX-CSLOT)
> (ELE:DISABLE-CLASS-INDEXING 'ELE-TESTS::IDX-
> CSLOT :ERRORP NIL)
> (SETF (FIND-CLASS 'ELE-TESTS::IDX-CSLOT) NIL))
> (DEFCLASS ELE-TESTS::IDX-CSLOT NIL ((ELE-
> TESTS::SLOT1 :INITARG :SLOT1 :INITFORM 0 :ACCESSOR ELE-TESTS::SLOT1))
> (:METACLASS ELE:PERSISTENT-METACLASS :INDEX T))
> (VALUES (ELE:CLASS-INDEXEDP-BY-NAME 'ELE-TESTS::IDX-
> CSLOT)))
> Expected value: T
> Actual value: NIL.
> ELE-TESTS::INDEXING-INHERIT ELE-TESTS::INDEXING-RANGE ELE-
> TESTS::INDEXING-SLOT-MAKUNBOUND
> Warning: Manually finalizing class IDX-FIVE-DEL
> Test ELE-TESTS::INDEXING-WIPE-INDEX failed
> Form: (PROGN (WHEN (ELE:CLASS-INDEXEDP-BY-NAME 'ELE-TESTS::IDX-FIVE-
> DEL)
> (ELE:DISABLE-CLASS-INDEXING 'ELE-TESTS::IDX-FIVE-
> DEL :ERRORP NIL)
> (SETF (FIND-CLASS 'ELE-TESTS::IDX-FIVE-DEL) NIL))
> (DEFCLASS ELE-TESTS::IDX-FIVE-DEL NIL ((ELE-
> TESTS::SLOT1 :INITARG :SLOT1 :INITFORM 1 :ACCESSOR ELE-
> TESTS::SLOT1 :INDEX T))
> (:METACLASS ELE:PERSISTENT-METACLASS))
> (ELE:WITH-TRANSACTION (:STORE-CONTROLLER ELE:*STORE-
> CONTROLLER*)
> (ELE:DROP-INSTANCES (ELE:GET-INSTANCES-BY-CLASS 'ELE-
> TESTS::IDX-FIVE-DEL))
> (MAKE-INSTANCE 'ELE-TESTS::IDX-FIVE-DEL))
> (LET ((ELE-TESTS::R1 (ELE:GET-INSTANCES-BY-VALUE 'ELE-
> TESTS::IDX-FIVE-DEL 'ELE-TESTS::SLOT1 1)))
> (DEFCLASS ELE-TESTS::IDX-FIVE-DEL NIL ((ELE-
> TESTS::SLOT1 :INITARG :SLOT1 :INITFORM 1 :ACCESSOR ELE-TESTS::SLOT1))
> (:METACLASS ELE:PERSISTENT-METACLASS))
> (VALUES (EQ (LENGTH ELE-TESTS::R1) 1) (ELE-
> TESTS::SIGNALS-ERROR (ELE:GET-INSTANCES-BY-VALUE 'ELE-TESTS::IDX-
> FIVE-DEL 'ELE-TESTS::SLOT1 1))
> (NULL (ELE:GET-INDEX (ELE:GET-VALUE 'ELE-
> TESTS::IDX-FIVE-DEL (ELE:CONTROLLER-CLASS-ROOT ELE:*STORE-
> CONTROLLER*)) 'ELE-TESTS::SLOT1)))))
> Expected values: T
> T
> T
> Actual value: #<SIMPLE-ERROR @ #x21202b72>.
> ELE-TESTS::INDEXING-RECONNECT-DB ELE-TESTS::INDEXING-CHANGE-CLASS
> ELE-TESTS::INDEXING-REDEF-CLASS
> Ranged get of 10/700 objects = Linear: 1.713 sec Indexed: 0.02 sec
> ELE-TESTS::INDEXING-TIMING
> Single store mode: ignoring ELE-TESTS::REMOVE-ELEMENT
> Single store mode: ignoring ELE-TESTS::MIGRATE-BASIC
> Single store mode: ignoring ELE-TESTS::MIGRATE-BTREE
> Single store mode: ignoring ELE-TESTS::MIGRATE-IDX-BTREE
> Single store mode: ignoring ELE-TESTS::MIGRATE-PCLASS
> Single store mode: ignoring ELE-TESTS::MIGRATE-IPCLASS ELE-
> TESTS::PREPARES-BDB ELE-TESTS::TEST-SEQ1 ELE-TESTS::TEST-SEQ2 ELE-
> TESTS::CLEANSUP-BDB
> 2 out of 125 total tests failed: ELE-TESTS::INDEXING-CLASS-OPT, ELE-
> TESTS::INDEXING-WIPE-INDEX.
> NIL
>
>
> Now I can not reproduc the three errors.
>
> Frank
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